X-ray diffractometer for quantum and information processing material 6-B175-Q-00103-00
Summary
AI-generated · Dec 19, 2025Procure an X-ray diffractometer for quantum and information processing material, with detailed requirements provided in the attached Statement of Work. If you can supply the item, submit a USD-proposal through the referenced RFQ process, addressing the required elements and providing a full price quote, along with information on shipping origin, lead time, country of origin, and all certifications and representations.
Include an executed ANL-70 RFQ and complete ANL-70A representations and certifications. For shipping terms, indicate Incoterms: overseas shipments should use DAP and include the HTS code; domestic shipments should use FOB Destination and confirm the quoted price is all-inclusive. Also review and accept the ANL-71 Commercial Terms and Conditions and the ANL-366M Supplemental Onsite Terms, and review the SOW for the X-ray diffractometer.
Argonne National Laboratory is seeking to procure the below. Please refer to the Statement of Work, attached, for further details. X-ray diffractometer for quantum and information processing material If able to provide the items listed above, please submit your proposal addressing the following requirements by December 24, 2025, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than December 22, 2025, at 12:00 PM CST. Executed ANL-70 Request for Quotation (Signed on Page 1) Proposal - Quoted in USD Shipping Origin If shipping from outside the USA, please confirm Incoterms of DAP are accepted. Additionally, please provide the appropriate HTS Code associated with order If shipping from within the USA, please confirm Incoterms FOB Destination are accepted and that the quoted price includes all costs associated with the order, and it will be the final price at invoicing. HTS code if drop shipping from outside of the USA. Lead Time Country of Origin of quoted item - See ANL-70 for further definition Complete Reps & Certs, ANL-70A dated 01/13/2025 Review and acceptance of the ANL-71 COM Terms and Conditions Review and acceptance of the ANL-366M Supplemental Onsite Terms Review of SOW, X-ray diffractometer for quantum and information processing material, dated 12/18/2025
From Solicitation posted on Dec 18, 2025Notice history
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Solicitation LATEST Posted Dec 18, 2025
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USA