TECHNOLOGY TRANSFER LICENSING OPPORTUNITY: Enhanced Software Suite Maximizes Non-Destructive Evaluation (NDE) Methods (MSC-TOPS-34) T2P-JSC-00059
Summary
AI-generated · Aug 28, 2025A software suite for post-processing flash infrared thermography data to enhance non-destructive evaluation (NDE) of structures is available for license. Developed at NASA Johnson Space Center, it offers quantitative and qualitative data analysis tools that reliably detect and characterize anomalies in composite materials and some metallic hardware. By incorporating Transient Thermography (faster flaw detection on thicker parts) and Lock-in Thermography (higher flaw resolution), it broadens applicability to other IR thermography techniques and improves operator accuracy and efficiency. License rights may be exclusive or nonexclusive and may include specific fields of use; NASA provides no funding.
To express interest, submit a license application through NASA’s Automated Technology Licensing Application System (ATLAS). For questions, contact NASA’s Technology Transfer Program with the technology title. Responses are for public awareness and preliminary market research, and no follow-on procurement is expected from responses.
NASA s Technology Transfer Program solicits inquiries from companies interested in obtaining license rights to commercialize, manufacture and market the following technology. License rights may be issued on an exclusive or nonexclusive basis and may include specific fields of use. NASA provides no funding in conjunction with these potential licenses. THE TECHNOLOGY: Researchers at NASA Johnson Space Center have developed novel techniques for post-processing of flash infrared (IR) thermography data, providing efficient and cost-effective enhancements to Non-Destructive Evaluation (NDE) of structures for numerous applications. Compatible with commercial IR thermography products, this suite of tools provides both quantitative and qualitative data analysis capabilities and reliable detection and characterization of anomalies in composite and some metallic hardware. By adding the Transient Thermography method, which is able to detect flaws on thicker parts faster than other methods, and the Lock-in Thermography method, which uses a sinusoidal power cycle to provide better flaw resolution, the Flash Thermography NDE Technology Suite has expanded its applicability to other commonly used infrared thermography techniques, enhancing operator accuracy and efficiency. To express interest in this licensing opportunity, please submit a license application through NASA s Automated Technology Licensing Application System (ATLAS) by visiting https://technology.nasa.gov/patent/MSC-TOPS-34 If you have any questions, please e-mail NASA s Technology Transfer Program at Agency-Patent-Licensing@mail.nasa.gov with the title of this Technology Transfer Opportunity as listed in this SAM.gov notice and your preferred contact information. For more information about licensing other NASA-developed technologies, please visit the NASA Technology Transfer Portal at https://technology.nasa.gov/. These responses are provided to members of NASA s Technology Transfer Program for the purpose of promoting public awareness of NASA-developed technology products, and conducting preliminary market research to determine public interest in and potential for future licensing opportunities. No follow-on procurement is expected to result from responses to this Notice.
From Special Notice posted on Aug 27, 2025Notice history
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