Milli-Kelvin Scanning Probe Microscope BSA473768
Summary
AI-generated · Mar 18, 2026Milli-Kelvin Scanning Probe Microscope. The instrument must operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature of 20 millikelvin or below, housed in a fully shielded, low-noise environment within high vacuum.
BSA is procuring a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV).
From Presolicitation posted on Mar 17, 2026BSA is procuring a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV).
From Presolicitation posted on Apr 02, 2026BSA is procuring a Milli-Kelvin Scanning Probe Microscope. The mK-SPM instrument, shall operate tuning-fork-based atomic force microscopy (TFAFM) and be designed to support optimum operation of scanning Microwave Impedance Microscopy (sMIM) and Scanning Resonator Microscopy (SRM) at a base temperature <= 20 mK inside a fully shielded low noise environment within high vacuum (HV).
From Solicitation posted on Apr 02, 2026Notice history
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Presolicitation LATEST Posted Apr 02, 2026View changes (1)
- Response Deadline: Apr 02, 2026 → Apr 18, 2026
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