Maintenance of Hitachi Scanning Electron Microscope (SEM) N6449825Q0209
Summary
AI-generated · Aug 25, 2025Procurement of preventative maintenance for Hitachi Scanning Electron Microscope (SEM), Model S-3700N, from Hitachi High-Tech America, Inc.
Sole-source action under FAR 13.106(b); the government intends to solicit and award the contract to that single source. Questions should be submitted via email to the designated point of contact; phone inquiries will not be accepted.
The Naval Surface Warface Center Philadelphia intends to procure preventative maintenance of Hitachi Scanning Electron Microscope (SEM), Model S-3700N from Hitachi High-Tech America, Inc. The proposed contract action is for supplies or services for which the Government intends to solicit and award with only one source under authority of FAR 13.106(b). Any questions regarding this notice should be emailed to: brooke.a.steele3.civ@us.navy.mil Phone calls will NOT be accepted.
From Special Notice posted on Jun 17, 2025Notice history
1Details
Award Information
Not yet awarded
Contacts
Phone
Agency
Place of Performance
USA