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Sources Sought Expired 1 notice 1 document

Gas Chromatograph with Flame Ionization Detector and Pulsed Discharge Helium Ionization Detector for Impurity Analysis of Semiconductor Gases NIST-SS26-CHIPS-33

Solicitation NIST-SS26-CHIPS-33 Copied Notice ID df918f857fea458e8820014238733cfb Copied COMMERCE, DEPARTMENT OF — DEPT OF COMMERCE NIST
SAM.gov
Posted
Mar 06, 2026
Deadline
Mar 19, 2026
Set-aside
None
NAICS
334516
PSC
6640

Summary

AI-generated · Mar 09, 2026

Gas chromatograph with a flame ionization detector and a pulsed discharge helium ionization detector is being sought to analyze impurities in semiconductor gases. This is a sources-sought market inquiry to gauge supplier capability and interest; full technical and qualification details are provided in the attached description.

Please see attached

From Sources Sought posted on Mar 06, 2026

Notice history

1
  1. Sources Sought LATEST Posted Mar 06, 2026
View Solicitation Overview

Details

Solicitation number NIST-SS26-CHIPS-33
Notice ID df918f857fea458e8820014238733cfb
Notice type Sources Sought
Product / Service (PSC) 6640
NAICS 334516
Place of performance Gaithersburg, Maryland
Archive date Apr 03, 2026

Award Information

Not yet awarded

Documents

1
Document 1
View on SAM.gov

Contacts

primary
Junee Johnson

Email

Agency

COMMERCE, DEPARTMENT OF
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
DEPT OF COMMERCE NIST

Place of Performance

Gaithersburg, Maryland 20899
USA

Dates

Posted Mar 06, 2026 5 months ago
Last Updated Aug 06, 2026 2 days ago
Due Mar 19, 2026 4 months ago