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Award Notice NONE 1 notice

Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) 1333ND26PNB030039

Solicitation 1333ND26PNB030039 Copied Notice ID dd96e5e5b43342f2a8c8899af4e24d7b Copied COMMERCE, DEPARTMENT OF — DEPT OF COMMERCE NIST
SAM.gov
Posted
Apr 06, 2026
Deadline
No deadline
Set-aside
NONE
NAICS
334516
PSC
5961

Summary

AI-generated · Apr 07, 2026

Procurement of a Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) system was awarded to FEI Company. FEI Company was awarded the contract to supply this instrument.

Notice history

1
  1. Award Notice LATEST Posted Apr 06, 2026
View Solicitation Overview

Details

Solicitation number 1333ND26PNB030039
Notice ID dd96e5e5b43342f2a8c8899af4e24d7b
Award number 1333ND26PNB030039
Notice type Award Notice
Product / Service (PSC) 5961
NAICS 334516
Set-aside No Set aside used
Place of performance Maryland
Archive date Apr 11, 2026

Award Information

Awardee
1
Total Awarded
$4,486,721.00
Award Date
Mar 27, 2026

Awardees

Company Name UEI CAGE Code Location
FEI COMPANY CL4ELDSNT465 1FJ95 Hillsboro, OR

Documents

No files available

View on SAM.gov

Contacts

primary
Nina Lin

Email

secondary
Forest Crumpler

Email

Agency

COMMERCE, DEPARTMENT OF
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
DEPT OF COMMERCE NIST

Place of Performance

Maryland 20899
USA

Dates

Posted Apr 06, 2026 4 months ago
Last Updated Aug 06, 2026 2 days ago
Awarded Mar 27, 2026 4 months ago