Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Instrument 1333ND26QNB030053

Solicitation 1333ND26QNB030053 Copied Notice ID c7581827b97a4646a242778fd96a1049 Copied COMMERCE, DEPARTMENT OF — DEPT OF COMMERCE NIST

SAM.gov

Posted

Feb 09, 2026

Deadline

Feb 23, 2026

Set-aside

NONE

NAICS

334516

PSC

6640

Summary

AI-generated · Feb 10, 2026

Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements is sought. This is a combined synopsis/solicitation; full technical and contractual requirements are provided in Solicitation 1333ND26QNB030053 along with Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses).

This National Institute of Standards and Technology (NIST) has a requirement for a Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) instrument capable of performing a suite of customized measurements. See attached Solicitation# 1333ND26QNB030053, and associated Attachments 1 (SOW) and 2 (Applicable Provisions and Clauses) for full details.

From Combined Synopsis/Solicitation posted on Feb 09, 2026

Notice history

Combined Synopsis/Solicitation LATEST Posted Feb 09, 2026 View

Details

Solicitation number 1333ND26QNB030053

Notice ID c7581827b97a4646a242778fd96a1049

Notice type Combined Synopsis/Solicitation

Product / Service (PSC) 6640

NAICS 334516

Set-aside No Set aside used

Place of performance Gaithersburg, Maryland

Archive date Mar 10, 2026

Award Information

Not yet awarded

Documents

Document 1

Document 2

Document 3

Contacts

primary

Nina Lin

secondary

Forest Crumpler

Agency

COMMERCE, DEPARTMENT OF

NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY

DEPT OF COMMERCE NIST

Place of Performance

Gaithersburg, Maryland 20899
USA

Dates

Posted Feb 09, 2026 5 months ago

Last Updated Aug 06, 2026 1 day ago

Due Feb 23, 2026 5 months ago