Benchtop Scanning Electron Microscope (SEM) 5-B175-Q-00601-00
Summary
AI-generated · Aug 23, 2025Procurement is for a benchtop scanning electron microscope (SEM).
The description field is blank, so no specific requirements, performance specifications, quantities, delivery or installation details, or any unique conditions (such as brand-name restrictions, certifications, or site visits) are provided in this record.
Argonne National Laboratory is seeking to procure Benchtop Scanning Electron Microscope a (SEM). Please refer to the Statement of Work, attached, for further details. If able to provide the items listed above, please submit your proposal addressing the following requirements by July 07, 2025, at 5:00 PM CST. For any questions, please contact jdoria@anl.gov no later than July 02, 2025, at 12:00 PM CST. - Executed ANL-70 Request for Quotation (Signed on Page 1) - Proposal - Quoted in USD - Proposal must be quoted using DAP Incoterms if shipping from outside the USA. If shipping from a domestic location, Incoterms must be FOB Destination. - HTS code if drop shipping from outside of the USA. - Lead Time - Country of Origin of quoted item - See ANL-70 for further definition - Complete Reps & Certs, ANL-70A dated 01/13/2025 - Review and acceptance of the ANL-71 COM Terms and Conditions - Review and acceptance of the ANL-366M Supplemental Onsite Terms - Review of SOW, Benchtop Scanning Electron Microscope a (SEM), dated 06/26/2025
From Solicitation posted on Jun 26, 2025Notice history
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Place of Performance
USA