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Combined Synopsis/Solicitation NONE Expired 1 notice 3 documents

Atomic Force Microscope for use in a Scanning Electron Microscope 1333ND26QNB030045

Solicitation 1333ND26QNB030045 Copied Notice ID 9665f77e810d47b6b0429db1a86d0563 Copied COMMERCE, DEPARTMENT OF — DEPT OF COMMERCE NIST
SAM.gov
Posted
Feb 10, 2026
Deadline
Feb 19, 2026
Set-aside
NONE
NAICS
334516
PSC
6640

Summary

AI-generated · Feb 11, 2026

Acquire an Atomic Force Microscope compatible with a Scanning Electron Microscope. The attached combined synopsis/solicitation provides the full technical specifications, integration requirements, and bid submission instructions; review the document for exact performance criteria, delivery terms, and acceptance conditions.

Please see attached combined synopsis/solicitation.

From Combined Synopsis/Solicitation posted on Feb 10, 2026

Notice history

1
  1. Combined Synopsis/Solicitation LATEST Posted Feb 10, 2026
View Solicitation Overview

Details

Solicitation number 1333ND26QNB030045
Notice ID 9665f77e810d47b6b0429db1a86d0563
Notice type Combined Synopsis/Solicitation
Product / Service (PSC) 6640
NAICS 334516
Set-aside No Set aside used
Place of performance Gaithersburg, Maryland
Archive date Mar 06, 2026

Award Information

Not yet awarded

Documents

3
Document 1
Document 2
Document 3
View on SAM.gov

Contacts

primary
Cielo Ibarra

Email

Agency

COMMERCE, DEPARTMENT OF
NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
DEPT OF COMMERCE NIST

Place of Performance

Gaithersburg, Maryland 20899
USA

Dates

Posted Feb 10, 2026 5 months ago
Last Updated Aug 06, 2026 2 days ago
Due Feb 19, 2026 5 months ago