66--Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM) 75N92025Q00101
Summary
AI-generated · Aug 24, 2025Procurement seeks a plasma-focused ion beam scanning electron microscope (FIB-SEM). This is a sources-sought notice to identify potential suppliers capable of providing this equipment for a future award.
Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM)
From Sources Sought posted on Aug 12, 2025Plasma-focused ion beam scanning electron microscope (FIB-SEM)
From Combined Synopsis/Solicitation posted on Sep 08, 2025Plasma-focused ion beam scanning electron microscope (FIB-SEM)
From Award Notice posted on Sep 22, 2025Notice history
3-
Sources Sought Posted Aug 12, 2025
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Combined Synopsis/Solicitation Posted Sep 08, 2025View changes (4)
- Title: 66--Purchase of a Plasma-focused ion beam scanning electron microscope (FIB-SEM) → Purchase of a Plasma-focused ion beam scanning ele
- Description: Description was updated
- Notice Type: Sources Sought → Combined Synopsis/Solicitation
- Response Deadline: Aug 19, 2025 → Sep 15, 2025
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Award Notice LATEST Posted Sep 22, 2025
Details
Award Information
Award Notices
Posted: Sep 22, 2025
Plasma-focused ion beam scanning electron microscope (FIB-SEM)
Awardees
| Company Name | UEI | CAGE Code | Location |
|---|---|---|---|
| FEI COMPANY | CL4ELDSNT465 | 1FJ95 | Hillsboro, OR |
Contacts
Phone